Re: Test cluster with high OIDs above the signed-int limit (2B+)

On Mon, Apr 20, 2026 at 9:08 AM Dominique Devienne <ddevienne(at)gmail(dot)com>
wrote:

> On Mon, Apr 20, 2026 at 2:59 PM Dominique Devienne <ddevienne(at)gmail(dot)com>
> wrote:
> > No. I don't even remember the exact bug
>
> Was an old test using lo_creat(-1) RETURNING the OID, and code doing
> `std::stoi(PQgetvalue(...))`. In production we don't use LO and use
> the binary protocol, so no such issue, still my original point
> remains. We process OIDs in several places, and making sure our test
> suite works with high OIDs would be better. If I fully control the
> cluster, which is created specifically for the test run, on-the-fly,
> it's like to be able to similate high OIDs "instantly".
>

It's an unsigned integer, so I'd say not use signed ints when processing
OIDs.

It's a valid question, though, what happens when the OID counter wraps
around and hits a duplicate.

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